Wydarzenia w AGH

Wykład zatytułowany Advancing Crystal Analysis: A Alternative Approach to Kikuchi Diffraction Pattern Interpretation wygłosi dr hab. inż. Tomasz Tokarski, prof. AGH z Akademickiego Centrum Materiałów i Nanotechnologii AGH.

Udział

• stacjonarny: ACMiN (ul. Kawiory 30, bud. D-16, II piętro, sala audytoryjna 1.02A)
• zdalny: platforma MS Teams (link)

Streszczenie

Kikuchi diffraction patterns, commonly used in EBSD/TKD systems, offer a wealth of information about the structure and orientation of crystals. However, traditional methods often focus narrowly on comparing these complex patterns to known standards, overlooking finer details. In this presentation, I will introduce a novel, standard-less approach to analysing Kikuchi diffraction patterns that unlocks deeper insights into crystal lattices. This method decomposes the diffraction image and tracks distortions in individual crystallographic planes, enabling precise imaging of strain fields at both the micro and nano scales. Examples of its application in material science will be discussed, showcasing its potential to enhance the study of lattice distortions and defects.